Launches New Optium Family of Automated Process Metrology Tools for Opto-Telecom Component Manufacturing

SAN JOSE, Calif.--(BUSINESS WIRE)--Jan. 25, 2001--Veeco Metrology Group, a world leader in information-age process metrology, launched its new Optium(TM) Substrate Mapper at the Photonics West show earlier this week. Part of the newly launched Optium product line, the Optium Substrate Mapper quickly identifies known good areas of filter substrates for maximum yield and minimum downstream processing of out-of-spec parts. This high-precision, automated system qualifies thin film process recipes by mapping filter performance as early as possible -- at the substrate level.

"By providing early process feedback prior to dicing, this system enables manufacturers to meet the demands for high-quality filter performance, fast time-to-market, and high-volume production," said Lloyd LaComb, Vice President and General Manager of Veeco Metrology Group. "As in other information-age sectors, Veeco has focused our core competencies on in-line monitoring and yield improvement, which empowers companies to speed new technologies to market. And the Optium metrology systems complement our process equipment - for example, the combination of our Substrate Mapper with Veeco's SPECTOR(R) Optical Coating System furnishes a complete solution for quicker next-generation product prototyping, accelerated production ramp and high-yield manufacturing of thin film filters."

Incorporating Veeco's advanced signal analysis with a high-performance tunable laser diode source and an industry-standard, multi-channel optical multimeter, the Substrate Mapper classifies filter zones according to user-definable wavelength and signal quality criteria. Flexible analysis software enables mapping of transmission and reflection characteristics, as well as phase-dependent loss. Optional machine vision and an integrated database capture and store absolute locations of good areas, which can then be converted for use at subsequent dicing operations.

New Optium Brand

The Substrate Mapper is part of Veeco's newly launched brand of production-ready opto-telecom metrology products, Optium. The term "Optium" combines the words 'optical' and 'optimum,' to describe what these products do: help optimize key processing steps for manufacturing of passive and active components (including laser diode sources, filters, mirror arrays, lenses, and optical fibers). Optium Laser Diode Inspection System, which ensures quality control via automated defect detection/classification and critical dimension measurement of source and pump diodes. The Optium Filter Inspection System, also recently announced, provides accurate, high-speed inspection of thin film filters, including high/low pass, DWDM, and gain flattening.

About Veeco

Veeco Instruments Inc. is a worldwide leader in process equipment and metrology tools for the optical telecommunications, data storage, semiconductor and research markets. Manufacturing and engineering facilities are located in New York, California, Colorado, Arizona and Minnesota. Global sales and service offices are located throughout the United States, Europe, Japan and Asia Pacific. Additional information on Veeco can be found at http://www.veeco.com.

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